Faulty Die
A wafer contains 100 dies. You are told 1 die is “super-leaky” (consumes 10x power). You have a probe that can test any group of dies together to measure their combined power. What is the minimum number of tests to find the leaky die?
A wafer contains 100 dies. You are told 1 die is “super-leaky” (consumes 10x power). You have a probe that can test any group of dies together to measure their combined power. What is the minimum number of tests to find the leaky die?